產品概述
硅膠材料擊穿試驗儀產品常規型號:
01、BDJC-10KV
02、BDJC-30KV
03、BDJC-50KV
04、BDJC-100KV
技術要求(qiu):
A、試驗方(fang)式:
直(zhi)流試(shi)驗:1、勻速(su)升壓(ya) 2、階梯升壓(ya) 3、耐壓(ya)試(shi)驗
交流試驗(yan):1、勻速升壓(ya) 2、階梯升壓(ya) 3、耐壓(ya)試驗(yan)
注:根據不同行(xing)業的標(biao)準(zhun)(zhun),我們(men)可以根據用戶(hu)的要求,依(yi)據貴行(xing)業標(biao)準(zhun)(zhun),為您定制行(xing)業標(biao)準(zhun)(zhun)所需的特殊測試(shi)功能。
B、電(dian)極規格:1、片(pian)材電(dian)極 ¢25mm 兩個 片(pian)材電(dian)極 ¢75mm一只
2、管用電極 兩個 、一套。
C、輸入電壓: 交流 220 V
D、輸出電壓: 交流 0--50 KV ;
直流 0--70 KV ;(同類產品做到50kv)
E、電器容量: 5KVA
F、高(gao)壓分級: 0--50KV 全(quan)程可調(采用(yong)高(gao)精度(du)電(dian)壓采樣器(qi)件(jian),取(qu)消了(le)同(tong)類廠家(jia)由于電(dian)壓采樣精度(du)不夠必須(xu)采用(yong)高(gao)壓分級的方式)
G、升壓速率:
100 V/S 200 V/S 500 V/S 1000 V/S 2500 V/S 3000 V/S (此項滿足 標準(zhun)里面極快速升壓試驗要(yao)求)
備注:本產品采(cai)用 直流伺服(fu)電機加載減(jian)速(su)機構,保(bao)證(zheng)了(le) 標(biao)準(zhun)里面(mian)關于極(ji)慢速(su)試驗和極(ji)快速(su)試驗的 要(yao)求,(一般廠家為皮帶輪機構,誤差較(jiao)大)保(bao)證(zheng)用戶(hu)可以自由(you)選(xuan)擇升(sheng)壓速(su)率,是目(mu)前同(tong)類產品中 滿足國標(biao)對于升(sheng)壓速(su)率要(yao)求的測試設備。可以根據用戶(hu)需求設定不同(tong)的升(sheng)壓速(su)率
H、電壓試驗(yan)精度: ≤ 1%
適用范圍
硅膠材料擊穿試驗儀主要適用于固體絕緣材料(如:塑料、橡膠、層壓材料、薄膜、樹脂、云母、陶瓷、玻璃、絕緣漆等絕緣材料及絕緣件)在工頻電壓或直流電壓下擊穿強度和耐電壓的測試。
設備安全保護(hu)功能:
1、 試(shi)驗在試(shi)驗箱(xiang)中進行,試(shi)驗箱(xiang)門(men)打開(kai)時電(dian)源加(jia)不到高壓變(bian)壓器輸入端(duan),即高壓側無電(dian)壓。100KV測試(shi)設備(bei)高壓電(dian)極(ji)距(ju)離試(shi)驗箱(xiang)壁(bi)的(de) 近距(ju)離大于(yu)370mm,50KV測試(shi)設備(bei)高壓電(dian)極(ji)距(ju)離試(shi)驗箱(xiang)壁(bi)的(de) 近距(ju)離大于(yu)250mm,試(shi)驗時即使(shi)人接觸(chu)箱(xiang)壁(bi)也不會有危險。
2、 設備要安裝單獨的(de)保護(hu)地(di)線。接保護(hu)地(di)線,主要是減(jian)少(shao)試(shi)樣(yang)擊(ji)穿時對周圍產生的(de)較強的(de)電(dian)磁干擾(rao)。也可避(bi)免控制(zhi)計(ji)算機失控。
2、 該試驗設備的(de)電路(lu)設有(you)多項保(bao)護措施,主要有(you):過流保(bao)護、失(shi)壓保(bao)護、漏(lou)電保(bao)護、短路(lu)保(bao)護、直流試驗放電報(bao)警等。
3、直(zhi)(zhi)流試(shi)驗放(fang)電(dian)(dian)報警(jing)功能(neng):在設備做完直(zhi)(zhi)流試(shi)驗時(shi),當開(kai)啟試(shi)驗門時(shi)設備會自(zi)動報警(jing),直(zhi)(zhi)至使(shi)用設備上的放(fang)電(dian)(dian)裝置放(fang)電(dian)(dian)后報警(jing)會自(zi)動取消.(注:因為直(zhi)(zhi)流試(shi)驗后不放(fang)電(dian)(dian)會危險到人身安全,不能(neng)直(zhi)(zhi)接(jie)拿(na)取電(dian)(dian)極,起到提醒使(shi)用人員放(fang)電(dian)(dian)以免造(zao)人身傷害)。
4、 試驗放(fang)電(dian)裝置,隨主機為(wei)一(yi)體化,改(gai)進了以往單獨配備一(yi)根放(fang)電(dian)桿的功能。
5、 六級(ji)高壓(ya)安全斷電(dian)(dian)控制:①總電(dian)(dian)源開(kai)(kai)(kai)關(guan)②高壓(ya)斷電(dian)(dian)開(kai)(kai)(kai)關(guan)(鑰匙開(kai)(kai)(kai)關(guan))③調(diao)壓(ya)器(qi)復位開(kai)(kai)(kai)關(guan)④試驗箱門安全開(kai)(kai)(kai)關(guan)⑤高壓(ya)變壓(ya)器(qi)輸入(ru)側限流空(kong)開(kai)(kai)(kai)⑥漏電(dian)(dian)保護開(kai)(kai)(kai)關(guan)
固體(ti)電介質擊穿(chuan)
導致(zhi)擊穿(chuan)(chuan)的 低臨界電(dian)(dian)壓(ya)稱為擊穿(chuan)(chuan)電(dian)(dian)壓(ya).均(jun)勻電(dian)(dian)場(chang)中(zhong),擊穿(chuan)(chuan)電(dian)(dian)壓(ya)與介(jie)(jie)質(zhi)厚(hou)度(du)之(zhi)比稱為擊穿(chuan)(chuan)電(dian)(dian)場(chang)強(qiang)度(du)(簡稱擊穿(chuan)(chuan)場(chang)強(qiang),又稱介(jie)(jie)電(dian)(dian)強(qiang)度(du)).它反映固體(ti)電(dian)(dian)介(jie)(jie)質(zhi)自(zi)身的耐電(dian)(dian)強(qiang)度(du).不均(jun)勻電(dian)(dian)場(chang)中(zhong),擊穿(chuan)(chuan)電(dian)(dian)壓(ya)與擊穿(chuan)(chuan)處(chu)介(jie)(jie)質(zhi)厚(hou)度(du)之(zhi)比稱為平均(jun)擊穿(chuan)(chuan)場(chang)強(qiang),它低于(yu)均(jun)勻電(dian)(dian)場(chang)中(zhong)固體(ti)介(jie)(jie)質(zhi)的介(jie)(jie)電(dian)(dian)強(qiang)度(du).固體(ti)介(jie)(jie)質(zhi)擊穿(chuan)(chuan)后,由于(yu)有巨(ju)大電(dian)(dian)流通(tong)過,介(jie)(jie)質(zhi)中(zhong)會出(chu)現(xian)熔化(hua)或(huo)(huo)燒焦的通(tong)道,或(huo)(huo)出(chu)現(xian)裂紋.脆性介(jie)(jie)質(zhi)擊穿(chuan)(chuan)時(shi),常發生材料的碎(sui)裂,可據此破碎(sui)非金屬礦石(shi).
固體(ti)電介質擊穿有3種(zhong)形式 :電擊穿,熱擊穿和電化學擊穿.
電(dian)(dian)(dian)(dian)(dian)(dian)(dian)擊(ji)(ji)穿(chuan)(chuan)(chuan)是(shi)因電(dian)(dian)(dian)(dian)(dian)(dian)(dian)場使(shi)(shi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)介(jie)質(zhi)(zhi)中積聚起足夠數量和(he)能(neng)量的(de)帶電(dian)(dian)(dian)(dian)(dian)(dian)(dian)質(zhi)(zhi)點而導(dao)致電(dian)(dian)(dian)(dian)(dian)(dian)(dian)介(jie)質(zhi)(zhi)失去(qu)絕緣(yuan)(yuan)性能(neng).熱(re)(re)(re)(re)擊(ji)(ji)穿(chuan)(chuan)(chuan)是(shi)因在電(dian)(dian)(dian)(dian)(dian)(dian)(dian)場作(zuo)用(yong)(yong)下,電(dian)(dian)(dian)(dian)(dian)(dian)(dian)介(jie)質(zhi)(zhi)內部熱(re)(re)(re)(re)量積累,溫(wen)(wen)度(du)過高而導(dao)致失去(qu)絕緣(yuan)(yuan)能(neng)力.電(dian)(dian)(dian)(dian)(dian)(dian)(dian)化(hua)(hua)學(xue)擊(ji)(ji)穿(chuan)(chuan)(chuan)是(shi)在電(dian)(dian)(dian)(dian)(dian)(dian)(dian)場,溫(wen)(wen)度(du)等因素作(zuo)用(yong)(yong)下,電(dian)(dian)(dian)(dian)(dian)(dian)(dian)介(jie)質(zhi)(zhi)發生緩慢(man)的(de)化(hua)(hua)學(xue)變化(hua)(hua),性能(neng)逐漸(jian)劣(lie)化(hua)(hua), 終喪(sang)失絕緣(yuan)(yuan)能(neng)力.固(gu)體電(dian)(dian)(dian)(dian)(dian)(dian)(dian)介(jie)質(zhi)(zhi)的(de)化(hua)(hua)學(xue)變化(hua)(hua)通常使(shi)(shi)其電(dian)(dian)(dian)(dian)(dian)(dian)(dian)導(dao)增(zeng)加 , 這會使(shi)(shi)介(jie)質(zhi)(zhi)的(de)溫(wen)(wen)度(du)上升,因而電(dian)(dian)(dian)(dian)(dian)(dian)(dian)化(hua)(hua)學(xue)擊(ji)(ji)穿(chuan)(chuan)(chuan)的(de) 終形式是(shi)熱(re)(re)(re)(re)擊(ji)(ji)穿(chuan)(chuan)(chuan).溫(wen)(wen)度(du)和(he)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓作(zuo)用(yong)(yong)時間對電(dian)(dian)(dian)(dian)(dian)(dian)(dian)擊(ji)(ji)穿(chuan)(chuan)(chuan)的(de)影響(xiang)小(xiao),對熱(re)(re)(re)(re)擊(ji)(ji)穿(chuan)(chuan)(chuan)和(he)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)化(hua)(hua)學(xue)擊(ji)(ji)穿(chuan)(chuan)(chuan)的(de)影響(xiang)大(da);電(dian)(dian)(dian)(dian)(dian)(dian)(dian)場局部不均勻性對熱(re)(re)(re)(re)擊(ji)(ji)穿(chuan)(chuan)(chuan)的(de)影響(xiang)小(xiao),對其他兩(liang)種(zhong)影響(xiang)大(da).
試驗環(huan)境:
⑴常態試驗環境:
溫度(du)為(wei)20±5℃,相對濕度(du)為(wei)65±5%。
⑵熱態試(shi)(shi)驗(yan)或潮濕環(huan)境試(shi)(shi)驗(yan)條件由產品標準參照錄中表2予(yu)以規(gui)定(ding)。
擊穿的(de)判斷:
試(shi)樣沿(yan)施加(jia)電壓方(fang)向及(ji)位置有(you)貫(guan)穿(chuan)小孔、開裂、燒焦等痕(hen)(hen)跡為擊穿(chuan),如痕(hen)(hen)跡不清可用重復(fu)施加(jia)試(shi)驗電壓來(lai)判斷。
影響表觀電氣(qi)強度的因素:
隨著樣(yang)品厚(hou)度的(de)增加而降低。(見下面的(de)“缺陷”)
隨(sui)著工作溫(wen)度的升高而降(jiang)低。
它隨(sui)著頻率的增加而(er)降低。
對于(yu)氣體(例如(ru)氮氣,六氟化(hua)硫),通常隨著濕度的(de)增(zeng)加而降低。
對(dui)于空(kong)氣,介(jie)電強度(du)隨(sui)著濕(shi)度(du)的增加而(er)略有增加,但隨(sui)著相(xiang)對(dui)濕(shi)度(du)的增加而(er)減小
軟(ruan)件功能:
1、試(shi)(shi)驗過程中可(ke)動態(tai)繪制(zhi)出試(shi)(shi)驗曲線(xian),試(shi)(shi)驗的曲線(xian)可(ke)以多種顏(yan)色疊加對比(bi),局(ju)部放大(da),曲線(xian)上任(ren)意一段可(ke)進行(xing)區域放大(da)分(fen)析;
2、可對試驗數據進行編(bian)輯修(xiu)改,靈活適用;
3、試(shi)驗條(tiao)件及測(ce)試(shi)結果等數據可自動存儲;
4、試驗報告格(ge)式(shi)靈活可變,適(shi)用于不(bu)同(tong)用戶的不(bu)同(tong)需求(qiu);
5、可對(dui)一組試驗中曲(qu)線數據的有效與(yu)否進行人為選(xuan)定;
6、試驗結(jie)果(guo)數據可導入EXECL、WORD文檔編輯;
7、軟(ruan)件設備人員管理功能,試(shi)(shi)驗(yan)人員可設置自己的試(shi)(shi)驗(yan)項(xiang)目和(he)試(shi)(shi)驗(yan)參數,設置自己的試(shi)(shi)驗(yan)內容后別人無(wu)法進(jin)入程序;
8、過電(dian)流保護(hu)裝(zhuang)置有(you)足夠(gou)的靈敏度,能夠(gou)保證試樣(yang)擊(ji)穿時在0.1s內切斷電(dian)源;
9、儀(yi)器(qi)(qi)運行的持久性: 儀(yi)器(qi)(qi)可連續(xu)運行使(shi)用(yong),不需為保護儀(yi)器(qi)(qi)而定(ding)期停機。
整(zheng)機組成(cheng):
1、升壓(ya)部(bu)件:由(you)調壓(ya)器和(he)高壓(ya)變壓(ya)器組(zu)成0~50KV的(de)升壓(ya)部(bu)分(fen)。
2、動部件:由步(bu)進電機均(jun)勻調節(jie)調壓(ya)器使(shi)加給高(gao)壓(ya)變(bian)(bian)壓(ya)器的電壓(ya)變(bian)(bian)化。
3、檢(jian)測部件(jian):由集成電(dian)路組成的(de)測量(liang)電(dian)路。通過信(xin)(xin)號(hao)線(xian)把檢(jian)測的(de)模擬信(xin)(xin)號(hao)和(he)開關(guan)信(xin)(xin)號(hao)傳(chuan)給計算機。
4、計算機(ji)軟件(jian):通過智能電路把由檢(jian)測(ce)設(she)備采集的測(ce)控信(xin)號傳給(gei)計算機(ji)。計算機(ji)根據采集的信(xin)息控制設(she)備運(yun)行并處理試驗結果。
5、試驗電極:根據國家標準(zhun)(1408.1-2006)隨設備(bei)提(ti)供三個(ge)電極,體(ti)規格為:Ф25mm×25mm兩個(ge);Ф75mm×25mm一個(ge)。
使用(yong)說明(ming):
1、試驗單位:對材(cai)料進(jin)行試驗檢測的單位名稱;
2、送試單(dan)位:送材料檢測的單(dan)位名稱;
3、試(shi)驗(yan)方式:選擇(ze)進行“交流試(shi)驗(yan)”或“直(zhi)流試(shi)驗(yan)”;
4、試驗方法(fa):可進行(xing)“擊穿”,“耐壓(ya)(ya)”,“梯度耐壓(ya)(ya)”試驗;
5、試驗人員:輸入檢測(ce)人員姓名(ming);
6、試驗溫度(du):輸(shu)入試驗溫度(du);
7、試驗(yan)(yan)濕度:輸(shu)入試驗(yan)(yan)濕度;
8、設(she)備型號:顯(xian)示機(ji)器(qi)型號,此處不可變;
9、執(zhi)行標準(zhun)(zhun):選(xuan)擇所(suo)使用的標準(zhun)(zhun);
10、試(shi)驗(yan)介質(zhi):選擇試(shi)驗(yan)介質(zhi),或可以自己編(bian)輯寫入(ru);
11、電極形(xing)狀:輸入(ru)電極形(xing)狀;
12、電(dian)極(ji)尺(chi)寸:輸入電(dian)極(ji)尺(chi)寸;
13、使(shi)用(yong)量程(cheng):選(xuan)擇使(shi)用(yong)量程(cheng),分為10KV、20kV、30kv、50kv、100kv;
14、峰降(jiang)電壓:用于(yu)判斷材料(liao)是否擊穿,必須輸(shu)入項;
15、初始電壓:用于耐壓和梯度(du)耐壓試驗,在(zai)試驗開始時將電壓升到的位置;
16、升(sheng)壓速度:選擇升(sheng)壓的速度,控制在試(shi)驗過(guo)程中升(sheng)壓的快(kuai)慢;
17、梯(ti)度電壓:用于(yu)梯(ti)度耐(nai)壓試驗(yan),設置每次升壓的梯(ti)度值;
18、梯(ti)度(du)(du)時間:用于梯(ti)度(du)(du)耐(nai)壓試驗(yan),設置在相應梯(ti)度(du)(du)的耐(nai)壓時間;
19、終止電壓:設置在試驗過程中電壓的(de)上限值(zhi);
20、試樣制備:設置試樣的制備信息;
21、材料(liao)名稱(cheng)(cheng):設置試(shi)驗材料(liao)的(de)名稱(cheng)(cheng);
22、試(shi)驗(yan)時(shi)間:選擇(ze)試(shi)驗(yan)時(shi)期(qi),或(huo)寫入試(shi)驗(yan)日(ri)期(qi)和(he)時(shi)間;
23、報告編號:設置報告編號信息(xi);
24、試(shi)樣(yang)(yang)(yang)編號:設(she)置試(shi)樣(yang)(yang)(yang)編號信息,試(shi)驗(yan)樣(yang)(yang)(yang)品的規格編碼及編號;
25、試(shi)樣(yang)形(xing)狀:設置試(shi)樣(yang)形(xing)狀;
26、試(shi)樣尺寸(cun):輸入(ru)試(shi)樣的尺寸(cun);
27、試樣厚度:輸入試樣厚度,用于計算試驗強(qiang)度,必須輸入;
28、應(ying) 用:確認此界(jie)面所(suo)做設置(zhi);
29、退 出:返(fan)回(hui)主(zhu)界面,設置無(wu)效;
- 上一個: GD*AT高頻微波介電常數試驗儀
- 下(xia)一個: BEST-3000電線電纜半導電橡塑電阻測試儀